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Research Facilities

Raman Spectrometer

Raman analysis of samples.

Atomic Force Microscope

Atomic Force Microscope (AFM) is used for the surface analysis in nanoscale.

High Resolution XRD

Studies the crystalline nature of thin film samples.

Nd-YAG laser

Used for pulsed laser deposition

Sputtering units

Two sputtering units with RF and DC compatibility.

Pulsed Laser Deposition units

Depostion chamber for PLD